Publications

• Finding the Needle in the Crash Stack: Industrial-Scale Crash Root Cause Localization with AutoCrashFL

  home Venue: Under Review 📝
  group Authors: Sungmin Kang, Sumi Yun, Jingun Hong, Shin Yoo, Gabin An
  visibility Preprint: https://arxiv.org/abs/2510.22530
  Fault Localization Crash Debugging Large Language Models Industrial Software Root Cause Analysis SAP HANA (C/C++)

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• METAMON: Finding Inconsistencies between Program Documentation and Behavior using Metamorphic LLM Queries

  home Venue: 2th International Workshop on Large Language Models for Code (LLM4Code@ICSE'25)
  group Authors: Hyeonseok Lee, Gabin An, Shin Yoo
  topic DOI: 10.1109/LLM4Code66737.2025.00020
  visibility Preprint: https://arxiv.org/abs/2502.02794
  Metamorphic Testing Code Documentation Large Language Models Oracle Problem Regression Test Defects4J (Java)

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• Lachesis: Predicting LLM Inference Accuracy using Structural Properties of Reasoning Paths

  home Venue: 6th International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest@ICSE'25)
  group Authors: Naryeong Kim, Sungmin Kang, Gabin An, Shin Yoo
  topic DOI: 10.1109/DEEPTEST66595.2025.00008
  visibility Preprint: https://arxiv.org/abs/2412.08281
  Large Language Models Self-Consistency Accuracy Prediction Defects4J (Java) BugsInPy (Python)

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• COSMosFL: Ensemble of Small Language Models for Fault Localisation

  home Venue: 2th International Workshop on Large Language Models for Code (LLM4Code@ICSE'25)
  group Authors: Hyunjoon Cho, Sungmin Kang, Gabin An, Shin Yoo
  topic DOI: 10.1109/LLM4Code66737.2025.00007
  visibility Preprint: https://arxiv.org/abs/2502.02908
  Fault Localization Ensemble Methods Small Language Models Evolutionary Algorithms Defects4J (Java)

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• Evaluating Machine Learning-Based Test Case Prioritization in the Real World: An Experiment with SAP HANA

  home Venue: 18th IEEE International Conference on Software Testing, Verification and Validation (ICST'25)
  group Authors: Jeongki Son, Gabin An, Jingun Hong, Shin Yoo
  road Track: Industry Track
  topic DOI: 10.1109/ICST62969.2025.10989019
  Test Case Prioritization Machine Learning Reinforcement Learning Industrial Software SAP HANA (C/C++)

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• Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching

  home Venue: 40th International Conference on Software Maintenance and Evolution (ICSME'24), Best Industry Paper Award 🏆
  group Authors: Gabin An, Juyeon Yoon, Thomas Bach, Jingun Hong, Shin Yoo
  road Track: Industry Track
  topic DOI: 10.1109/ICSME58944.2024.00078
  visibility Preprint: https://arxiv.org/abs/2310.06298
  Flaky Test Continuous Integration Error Message Failure Symptoms Test Optimization Industrial Software SAP HANA (C/C++)

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• A Quantitative and Qualitative Evaluation of LLM-based Explainable Fault Localization

  home Venue: Proceedings of the ACM on Software Engineering and Volume 1, Number FSE (FSE'24)
  group Authors: Sungmin Kang*, Gabin An*, Shin Yoo
  road Track: Research Track
  topic DOI: 10.1145/3660771
  visibility Preprint: https://arxiv.org/abs/2308.05487
  Fault Localization Large Language Models Automated Debugging Root Cause Analysis Defects4J (Java) BugsInPy (Python)

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• Iterative Refactoring of Real-World Open-Source Programs with Large Language Models

  home Venue: 16th International Symposium on Search-Based Software Engineering (SSBSE'24)
  group Authors: Jinsu Choi, Gabin An, Shin Yoo
  road Track: Challenge Track
  topic DOI: 10.1007/978-3-031-64573-0_4
  visibility Preprint: https://coinse.github.io/publications/pdfs/Choi2024aa.pdf
  Code Refactoring Large Language Models Cyclomatic Complexity Defects4J (Java)

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• Learning Test-Mutant Relationship for Accurate Fault Localisation

  home Venue: Information and Software Technology
  group Authors: Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo
  topic DOI: 10.1016/J.INFSOF.2023.107272
  visibility Preprint: https://arxiv.org/abs/2306.02319
  Mutation Testing Fault localization Mutation-based Fault Localization Defects4J (Java)

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• BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++

  home Venue: 38th IEEE/ACM International Conference on Automated Software Engineering (ASE'23)
  group Authors: Gabin An, Minhyuk Kwon, Kyunghwa Choi, Jooyong Yi, Shin Yoo
  road Track: Tool Demos
  topic DOI: 10.1109/ASE56229.2023.00208
  Software Testing Defect Benchmark C/C++

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• Fonte: Finding Bug Inducing Commits from Failures

  home Venue: 45th IEEE/ACM International Conference on Software Engineering (ICSE'23)
  group Authors: Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo
  road Track: Technical Track
  topic DOI: 10.1109/ICSE48619.2023.00059
  visibility Preprint: https://arxiv.org/abs/2212.06376
  Bug Inducing Commit Fault Localization Git Commit History Weighted Bisection Batch Testing Industrial Software Defects4J (Java) SAP HANA (C/C++)

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• Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA

  home Venue: 44th IEEE/ACM International Conference on Software Engineering (ICSE'22)
  group Authors: Gabin An*, Juyeon Yoon*, Jeongju Sohn, Jingun Hong, Dongwon Hwang, Shin Yoo
  road Track: SEIP Track
  topic DOI: 10.1145/3510457.3513051
  Continuous Integration Test Similarity Failure Similarity Root Cause Analysis Hypergraphs Industrial Software SAP HANA (C/C++)

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• FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases

  home Venue: 31st ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA'22)
  group Authors: Gabin An, Shin Yoo
  road Track: Technical Track
  topic DOI: 10.1145/3533767.3534370
  Fault Diagnosability Coverage Test Selection Test Suite Augmentation Iterative Fault Localization Defects4J (Java)

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• Ahead of Time Mutation Based Fault Localisation using Statistical Inference

  home Venue: 32nd International Symposium on Software Reliability Engineering (ISSRE'21)
  group Authors: Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo
  road Track: Research Track
  topic DOI: 10.1109/ISSRE52982.2021.00036
  Mutation Testing Fault localization Mutation-based Fault Localization Defects4J (Java)

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• Searching for Multi-Fault Programs in Defects4J

  home Venue: 13th International Symposium on Search Based Software Engineering (SSBSE'21)
  group Authors: Gabin An, Juyeon Yoon, Shin Yoo
  road Track: Challenge Track
  topic DOI: 10.1007/978-3-030-88106-1_11
  visibility Preprint: https://arxiv.org/abs/2108.04455
  Software Faults Multiple Faults Bug Database Defects4J (Java)

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• Reducing the Search Space of Bug Inducing Commits using Failure Coverage

  home Venue: 29th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE'21)
  group Authors: Gabin An, Shin Yoo
  road Track: Ideas, Visions, and Reflections Track
  topic DOI: 10.1145/3468264.3473129
  Bug Inducing Commit Test Coverage Commit History Defects4J (Java)

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• Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study

  home Venue: 14th IEEE International Conference on Software Testing, Verification and Validation (ICST'21)
  group Authors: Jeongju Sohn*, Gabin An*, Jingun Hong, Dongwon Hwang, Shin Yoo
  road Track: Industry Track
  topic DOI: 10.1109/ICST49551.2021.00041
  Fault Localization Spectrum-based Fault Localization Test Suite Diagnosability Voting Industrial Software SAP HANA (C/C++)

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• PyGGI 2.0: Language Independent Genetic Improvement Framework

  home Venue: 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE'19)
  group Authors: Gabin An, Aymeric Blot, Justyna Petke, Shin Yoo
  road Track: Tool Demos
  topic DOI: 10.1145/3338906.3341184
  Search-based Software Engineering Genetic Improvement PyGGI Python Framework

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• Comparing Line and AST Granularity Level for Program Repair using PyGGI

  home Venue: 4th Genetic Improvement Workshop (GI@ICSE'18)
  group Authors: Gabin An, Jinhan Kim, Shin Yoo
  topic DOI: 10.1145/3194810.3194814
  Search-based Software Engineering Genetic Improvement Automated Program Repair PyGGI Python Framework